Date: February 25, 2026
Time: 3:00AM - 5:00AM CST
Duration: 2 Hours
Location: Online
Detect Failures and Ensure Quality with Lock-in Thermography for Electronics
Lock-in thermography is a powerful method for accurate analysis of electronic components. This method provides highly detailed information about every step of the production and testing process in electronics manufacturing, critical for the design of complex electronic circuits and assemblies.
This free online event hosted by InfraTec will explore how to detect defects such as hot spots, short circuits and soldering issues in R&D, quality assurance and process monitoring in the electronics industry.
Webinar Topics At A Glance:
- Failure analysis and defect inspection
- Quality and process control
- Flexible R&D solution
- Basic configuration to turnkey solution
- Hotspot detection on printed circuit boards, integrated circuits, semiconductor material and multi-chip modules
- Detection of faulty thermal connections of heat sinks, short circuits, soldering defects and wire bonding errors
This event will include a technical lecture titled Semiconductor IR-LIT Analytics - Challenges and Case Studies by Marko Hoffmann from InfineonTechnologies Dresden GmbH & Co. KG
This webinar takes place on Wednesday February 25th, 2026 at 3:00AM - 5:00AM CST