Extending Inspection Beyond Visible Imaging
JAI has introduced the newest addition to their Wave camera series, the Wave WAA-1300-GE-TEC. This new area scan solution combines visible and short-wave infrared (SWIR) imaging capabilities into a single solution.
Featuring an advanced 1280 x 1024 pixel InGaAs sensor with sensitivity ranging from 400 - 1700 nm, this camera enables detection of material characteristics and features that may be missed with conventional imaging technologies. The Wave WAA-1300-GE-TEC delivers frame rates up to 90 fps and high quantum efficiency, as well as an integrated Thermo-Electric Cooling (TEC) to actively regulate sensor temperature and maintain consistent imaging performance. This reduction in sensor temperature results in lower dark noise, improved image quality and dynamic range, preserved calibration accuracy, and enhanced image consistency under changing environmental conditions.
Wave WAA-1300-GE-TEC Key Features:
- 1.3 Megapixel resolution
- Spectral response from 400-1700 nm
- Up to 90 frames per second
- 5 µm square pixels
- GigE Vision interface
- C-mount lens mount
- TE Cooled
Designed for a Wide Range of Applications
The Wave WAA-1300-GE-TEC offers broad spectral sensitivity making it suitable for a number of industrial inspection, measurement and sorting applications:
- Fruit and vegetable sorting and grading
- Semiconductor alignment
- Recycling
- Laser beam profiling
- Plastic seal inspection
Learn more or request a quote on our product page: JAI Wave Series (900-1700 nm)
